标题
Failure time prediction for mechanical device based on the degradation sequence
作者
关键词
Failure time prediction, Degradation sequence, Mechanical device, Exponential regression, Parametric empirical Bayes
出版物
JOURNAL OF INTELLIGENT MANUFACTURING
Volume 26, Issue 6, Pages 1181-1199
出版商
Springer Nature
发表日期
2013-12-04
DOI
10.1007/s10845-013-0849-4
参考文献
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