4.3 Article

Nano-laminography for three-dimensional high-resolution imaging of flat specimens

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JOURNAL OF INSTRUMENTATION
卷 8, 期 -, 页码 -

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IOP PUBLISHING LTD
DOI: 10.1088/1748-0221/8/05/C05006

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Computerized Tomography (CT) and Computed Radiography (CR); Inspection with x-rays; Multi-modality systems; Detection of defects

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Developed for non-destructive three-dimensional (3D) imaging of flat specimens, synchrotron-radiation computed laminography (SR-CL) complements the established method of computed tomography (CT) which is optimised towards rod-like specimens elongated along one direction. SR-CL is realised by the inclination of the tomographic axis with respect to the incident x-ray beam by a defined angle. Its potential for 3D imaging of regions of interests in flat specimens has been demonstrated in various fields of investigation, e. g. in nondestructive device testing, cultural heritage studies, materials science and life sciences. Here we report on the latest developments of SR-CL at the ESRF beamline ID22NI which is dedicated to 3D nano-scale imaging using phase contrast and x-ray fluorescence. For the life sciences, the attractiveness of nano-laminography stems from the ability to study large heterogeneous samples at relatively low resolution in 2D or 3D and, subsequently, to focus on the regions of interest for high resolution 3D imaging.

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