4.4 Article Proceedings Paper

Formation of AlN layer on (111)Al substrate by ammonia nitridation

期刊

JOURNAL OF CRYSTAL GROWTH
卷 311, 期 10, 页码 2844-2846

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2009.01.026

关键词

RHEED; XPS; Molecular beam epitaxy; Nitrides

向作者/读者索取更多资源

AlN layers were formed on (1 1 1)Al substrates at a temperature below the melting point of Al using preheated ammonia in vacuum. The effect of the removal of the surface oxides on the substrate in the process was investigated. It was found that treatment using a buffered HF solution and subsequent annealing in vacuum was effective for obtaining a clean Al substrate surface. It was clarified that the removal of the surface oxides is required for the nitridation of Al substrates at a low temperature below the melting point of Al. (C) 2009 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据