Depth profile analysis of nanometric layers by laser-induced breakdown spectroscopy

标题
Depth profile analysis of nanometric layers by laser-induced breakdown spectroscopy
作者
关键词
nanometric layers, depth profiling, thickness measurement, laser-induced breakdown spectroscopy
出版物
Journal of Applied Spectroscopy
Volume 80, Issue 1, Pages 153-157
出版商
Springer Nature
发表日期
2013-04-16
DOI
10.1007/s10812-013-9738-z

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started