Role of the early stages of Ni-Si interaction on the structural properties of the reaction products

Nanoscale study of the current transport through transrotational NiSi/n-Si contacts by conductive atomic force microscopy

(2013) Alessandra Alberti et al.   APPLIED PHYSICS LETTERS

Silicided Au/Ni bilayer on p-type [001] silicon for low contact resistance metallization schemes

(2012) Paolo Badalà et al.   MICROELECTRONIC ENGINEERING

Schottky Barrier Inhomogeneities in Nickel Silicide Transrotational Contacts

(2011) Alessandra Alberti et al.   Applied Physics Express

Structural and electrical characterization of silicided Ni/Au contacts formed at low temperature (

(2011) A. Alberti et al.   JOURNAL OF APPLIED PHYSICS

Simultaneous nickel silicidation and silicon crystallization induced by excimer laser annealing on plastic substrate

(2010) A. Alberti et al.   APPLIED PHYSICS LETTERS

Composition measurement of the Ni-silicide transient phase by atom probe tomography

(2010) K. Hoummada et al.   APPLIED PHYSICS LETTERS

High-Performance Polycrystalline Silicon TFT on the Structure of a Dopant-Segregated Schottky-Barrier Source/Drain

(2010) Sung-Jin Choi et al.   IEEE ELECTRON DEVICE LETTERS

Nickel-affected silicon crystallization and silicidation on polyimide by multipulse excimer laser annealing

(2010) A. Alberti et al.   JOURNAL OF APPLIED PHYSICS

Low temperature formation and evolution of a 10 nm amorphous Ni–Si layer on [001] silicon studied by in situ transmission electron microscopy

(2009) Alessandra Alberti et al.   JOURNAL OF APPLIED PHYSICS

Electrical properties of the graphene/4H-SiC(0001) interface probed by scanning current spectroscopy

(2009) S. Sonde et al.   PHYSICAL REVIEW B

Tuning the Schottky barrier height of nickel silicide on p-silicon by aluminum segregation

(2008) Mantavya Sinha et al.   APPLIED PHYSICS LETTERS

Modified NiSi∕Si Schottky Barrier Height by Nitrogen Implantation

(2008) Pankaj Kalra et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Refining of silicon during its solidification from a Si–Al melt

(2008) Takeshi Yoshikawa et al.   JOURNAL OF CRYSTAL GROWTH

Low-Temperature Annealing Combined with Laser Crystallization for Polycrystalline Silicon TFTs on Polymeric Substrate

(2008) V. Privitera et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY