Low temperature formation and evolution of a 10 nm amorphous Ni–Si layer on [001] silicon studied by in situ transmission electron microscopy

出版年份 2009 全文链接

标题

作者

关键词

出版物

Volume 105, Issue 9, Pages 093506

出版商

AIP Publishing

发表日期

2009-05-05

DOI

10.1063/1.3122140

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