Interfacial band configuration and electrical properties of LaAlO3/Al2O3/hydrogenated-diamond metal-oxide-semiconductor field effect transistors
出版年份 2013 全文链接
标题
Interfacial band configuration and electrical properties of LaAlO3/Al2O3/hydrogenated-diamond metal-oxide-semiconductor field effect transistors
作者
关键词
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出版物
JOURNAL OF APPLIED PHYSICS
Volume 114, Issue 8, Pages 084108
出版商
AIP Publishing
发表日期
2013-08-29
DOI
10.1063/1.4819108
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Electrical characteristics of hydrogen-terminated diamond metal-oxide-semiconductor with atomic layer deposited HfO2 as gate dielectric
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