Effects of hydrogen, oxygen, and argon annealing on the electrical properties of ZnO and ZnO devices studied by current-voltage, deep level transient spectroscopy, and Laplace DLTS

标题
Effects of hydrogen, oxygen, and argon annealing on the electrical properties of ZnO and ZnO devices studied by current-voltage, deep level transient spectroscopy, and Laplace DLTS
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 111, Issue 9, Pages 094504
出版商
AIP Publishing
发表日期
2012-05-04
DOI
10.1063/1.4709728

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