Channel direction, effective field, and temperature dependencies of hole mobility in (110)-oriented Ge-on-insulator p-channel metal-oxide-semiconductor field-effect transistors fabricated by Ge condensation technique

标题
Channel direction, effective field, and temperature dependencies of hole mobility in (110)-oriented Ge-on-insulator p-channel metal-oxide-semiconductor field-effect transistors fabricated by Ge condensation technique
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 109, Issue 3, Pages 033709
出版商
AIP Publishing
发表日期
2011-02-04
DOI
10.1063/1.3537919

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