Imaging single electrons to enable the generation of ultrashort beams for single-shot femtosecond relativistic electron diffraction
出版年份 2011 全文链接
标题
Imaging single electrons to enable the generation of ultrashort beams for single-shot femtosecond relativistic electron diffraction
作者
关键词
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出版物
JOURNAL OF APPLIED PHYSICS
Volume 110, Issue 7, Pages 074512
出版商
AIP Publishing
发表日期
2011-10-08
DOI
10.1063/1.3646465
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Transmission-electron diffraction by MeV electron pulses
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