High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

标题
High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector
作者
关键词
-
出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 1, Pages 013306
出版商
AIP Publishing
发表日期
2010-01-23
DOI
10.1063/1.3292683

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