Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence

Bulk minority carrier lifetimes and doping of silicon bricks from photoluminescence intensity ratios

(2011) Bernhard Mitchell et al.   JOURNAL OF APPLIED PHYSICS

Luminescence imaging for inline characterisation in silicon photovoltaics

(2011) Thorsten Trupke et al.   Physica Status Solidi-Rapid Research Letters

Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging

(2011) Jonas Haunschild et al.   Physica Status Solidi-Rapid Research Letters

Accurate measurement of the formation rate of iron–boron pairs in silicon

(2011) J Tan et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Measuring dopant concentrations in p-type silicon using iron-acceptor pairing monitored by band-to-band photoluminescence

(2011) S.Y. Lim et al.   SOLAR ENERGY MATERIALS AND SOLAR CELLS

Advanced luminescence based effective series resistance imaging of silicon solar cells

(2008) H. Kampwerth et al.   APPLIED PHYSICS LETTERS

Imaging interstitial iron concentrations in boron-doped crystalline silicon using photoluminescence

(2008) D. Macdonald et al.   JOURNAL OF APPLIED PHYSICS