Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks

标题
Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 11, Pages 114104
出版商
AIP Publishing
发表日期
2010-06-04
DOI
10.1063/1.3391181

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