Complete elliptical ring geometry provides energy and instrument calibration for synchrotron-based two-dimensional X-ray diffraction

标题
Complete elliptical ring geometry provides energy and instrument calibration for synchrotron-based two-dimensional X-ray diffraction
作者
关键词
-
出版物
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 46, Issue 5, Pages 1249-1260
出版商
International Union of Crystallography (IUCr)
发表日期
2013-09-17
DOI
10.1107/s0021889813022437

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