A study of threshold switching of NbO2 using atom probe tomography and transmission electron microscopy

标题
A study of threshold switching of NbO2 using atom probe tomography and transmission electron microscopy
作者
关键词
Threshold switching, NbO, 2, Voltage drop, Atom probe, Local crystallization
出版物
MICRON
Volume 79, Issue -, Pages 101-109
出版商
Elsevier BV
发表日期
2015-08-29
DOI
10.1016/j.micron.2015.07.015

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