Reliability studies of vertical GaN devices based on bulk GaN substrates

出版年份 2015 全文链接

标题

作者

关键词

GaN, Reliability, Power electronics, Bulk GaN substrates, Avalanche breakdown

出版物

Volume 55, Issue 9-10, Pages 1654-1661

出版商

Elsevier BV

发表日期

2015-07-17

DOI

10.1016/j.microrel.2015.07.012

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