Analysis of dielectric breakdown in CoFeB/MgO/CoFeB magnetic tunnel junction

标题
Analysis of dielectric breakdown in CoFeB/MgO/CoFeB magnetic tunnel junction
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 55, Issue 6, Pages 894-902
出版商
Elsevier BV
发表日期
2015-03-09
DOI
10.1016/j.microrel.2015.02.018

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