期刊
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
卷 33, 期 -, 页码 16-23出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2015.01.012
关键词
Chalcogenides; Polyol synthesis; X-ray diffraction; Dielectric properties; Electrical properties
Using simple and low cost polyol method, alpha-NiS particles are synthesized at different pH conditions (pH 7-pH 14). Single phase formation and possible functional groups of alpha-NiS are identified through X-ray diffraction (XRD), and Fourier transforms infrared (FT-IR) spectroscopy, respectively. Further, X-ray photoelectron spectroscopy (XPS) clearly reveals the phase purity of alpha-NiS particles. Scanning electron microscopic (SEM) images reveals the presence of pseudo-spherical particles within the size range of 200-400 nm. Subsequently, the grain size alters the optical and electrical properties of the samples significantly. Similarly, alpha-NiS prepared at pH 8 provides high dielectric constant (2.3 x 10(4)), and low dielectric loss (13 x 10(3)), than the sample prepared at pH 7 of alpha-NiS. (C) 2015 Elsevier Ltd. All rights reserved.
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