Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

标题
Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM
作者
关键词
-
出版物
IEEE TRANSACTIONS ON MAGNETICS
Volume 50, Issue 11, Pages 1-4
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2014-12-03
DOI
10.1109/tmag.2014.2321551

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