High reliability sensing circuit for deep submicron spin transfer torque magnetic random access memory

出版年份 2013 全文链接

标题

作者

关键词

出版物

Volume 49, Issue 20, Pages 1283-1285

出版商

Institution of Engineering and Technology (IET)

发表日期

2013-09-24

DOI

10.1049/el.2013.2319

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