Defect Inspection of Flip Chip Solder Bumps Using an Ultrasonic Transducer

标题
Defect Inspection of Flip Chip Solder Bumps Using an Ultrasonic Transducer
作者
关键词
-
出版物
SENSORS
Volume 13, Issue 12, Pages 16281-16291
出版商
MDPI AG
发表日期
2013-11-28
DOI
10.3390/s131216281

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