Effect of Zinc/Tin Composition Ratio on the Operational Stability of Solution-Processed Zinc–Tin–Oxide Thin-Film Transistors

Fast and Stable Solution-Processed Transparent Oxide Thin-Film Transistor Circuits

(2011) Kwang Ho Kim et al.   IEEE ELECTRON DEVICE LETTERS

The status and perspectives of metal oxide thin-film transistors for active matrix flexible displays

(2011) Jae Kyeong Jeong   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Improvement in the photon-induced bias stability of Al–Sn–Zn–In–O thin film transistors by adopting AlOx passivation layer

(2010) Shinhyuk Yang et al.   APPLIED PHYSICS LETTERS

Highly Reliable Amorphous Silicon Gate Driver Using Stable Center-Offset Thin-Film Transistors

(2010) Jae Won Choi et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Effect of Metallic Composition on Electrical Properties of Solution-Processed Indium-Gallium-Zinc-Oxide Thin-Film Transistors

(2010) Yong-Hoon Kim et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

Effects of Li doping on the performance and environmental stability of solution processed ZnO thin film transistors

(2009) Pradipta K. Nayak et al.   APPLIED PHYSICS LETTERS

Fabrication conditions for solution-processed high-mobility ZnO thin-film transistors

(2009) Chen-sha Li et al.   JOURNAL OF MATERIALS CHEMISTRY

High performance solution-processed amorphous zinc tin oxide thin film transistor

(2009) Seok-Jun Seo et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Bias Stress Stability of Solution-Processed Zinc Tin Oxide Thin-Film Transistors

(2009) Youngmin Jeong et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Tuning of operation mode of ZnO nanowire field effect transistors by solvent-driven surface treatment

(2009) Woojin Park et al.   NANOTECHNOLOGY

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

The Effect of Gate-Bias Stress and Temperature on the Performance of ZnO Thin-Film Transistors

(2008) R.B.M. Cross et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY