Vertical Leakage/Breakdown Mechanisms in AlGaN/GaN-on-Si Devices

标题
Vertical Leakage/Breakdown Mechanisms in AlGaN/GaN-on-Si Devices
作者
关键词
-
出版物
IEEE ELECTRON DEVICE LETTERS
Volume 33, Issue 8, Pages 1132-1134
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2012-07-12
DOI
10.1109/led.2012.2200874

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