Benchmarking of Thermal Boundary Resistance in AlGaN/GaN HEMTs on SiC Substrates: Implications of the Nucleation Layer Microstructure

出版年份 2010 全文链接

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作者

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出版物

Volume 31, Issue 12, Pages 1395-1397

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2010-10-20

DOI

10.1109/led.2010.2077730

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