JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

期刊名

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

J ELECTRON TEST

ISSN / eISSN

0923-8174 / 1573-0727

目标和范围

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:
Testing of VLSI devices printed circuit boards, and electronic systems;
Testing of analog and digital electronic circuits;
Testing of microprocessors, memories, and signal processing devices;
Fault modeling;
Test generation;
Fault simulation;
Testability analysis;
Design for testability;
Synthesis for testability;
Built-in self-test;
Test specification;
Fault tolerance;
Formal verification of hardware;
Simulation for verification;
Design debugging;
AI methods and expert systems for test and diagnosis;
Automatic test equipment (ATE);
Test fixtures;
Electron Beam Test Systems;
Test programming;
Test data analysis;
Economics of testing;
Quality and reliability;
CAD Tools;
Testing of wafer-scale integration devices;
Testing of reliable systems;
Manufacturing yield and design for yield improvement;
Failure mode analysis and process improvement

研究方向

工程：电子与电气

CiteScore

1.90 查看趋势图

CiteScore 学科排名

类别	分区	排名
Engineering - Electrical and Electronic Engineering	Q3	#490/738

Web of Science 核心合集

Science Citation Index Expanded (SCIE)	Social Sciences Citation Index (SSCI)
Indexed	-

类别 (Journal Citation Reports 2023)	分区
ENGINEERING, ELECTRICAL & ELECTRONIC - SCIE	Q4

H-index

31

出版国家或地区

UNITED STATES

出版商

Springer US

出版周期

Bimonthly

出版年份

1990

年文章数

46

Open Access

NO

通讯方式

SPRINGER, VAN GODEWIJCKSTRAAT 30, DORDRECHT, NETHERLANDS, 3311 GZ