期刊
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
卷 67, 期 10, 页码 1804-1808出版社
KOREAN PHYSICAL SOC
DOI: 10.3938/jkps.67.1804
关键词
ZnO; ITO; Photoluminescence; Photocurrent
资金
- National Science Council of Taiwan [NSC 101-2112-M-002-026]
- Aim for Top University Project of National Taiwan University [102R4000]
Photoluminescence (PL) spectra of zinc oxide (ZnO) samples with different hydrogen peroxide (H2O2) treatment durations were measured to examine several point defects on the surfaces of the films. The results suggest successful oxidation through the reaction between oxygen radicals dissociated from H2O2 and the ZnO surface. To further confirm the defect-induced gain mechanism, we fabricated highly transparent indium-tin-oxide (ITO)/ZnO Schottky diodes and measured the key diode characteristics. Photocurrents were measured at different wavelengths, and possible explanations for the high optical gain within the ultraviolet (UV) region are provided.
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