Assessing genetic resistance to spot blotch, Stagonospora nodorum blotch and tan spot in wheat from Nepal

Fungal leaf spot diseases of wheat (Triticum aestivum L.) in Nepal cause significant yield reduction. Although field testing has identified a few partially resistant cultivars, most wheat grown in Nepal lacks adequate resistance to leaf spot diseases. During 2009-2010, 116 local and commercial spring wheat cultivars and advanced breeding lines were selected from multi-year field experiments in Nepal and evaluated for seedling resistance to three leaf spot diseases: spot blotch, Stagonospora nodorum blotch (SNB) and tan spot races 1 and 5 (two of the most prevalent races) in the growth chambers at North Dakota State University, Fargo, ND, USA. The wheat cultivars and lines were artificially inoculated with individual pathogens or races at the two-leaf stage and disease reactions were evaluated 6 to 10 days after inoculation (DAI). Results indicated that 30%, 31%, 19% and 10% of the tested wheat cultivars and lines were resistant to spot blotch, SNB, tan spot races 1 and 5, respectively. Six advanced breeding lines (SW89-5422, BL 2127 = DANIAL88/HLB30//NL297, BL 3033, FILIN/IRENA/5/CNDO/R143//ENTE/MEXI-2/3/AE. SQUA (TAUS)/4WEAVER, GAN/AE.SQUARROSA (236)//DOY1/AE.SQUARROSA(447)/3/MAIZ/4/INQALAB91, Mayoor//TK SN1081/Ae. Squarrosa (222)/3/FCT, were resistant to spot blotch, SNB and tan spot race 1. Similarly, two wheat cultivars Chirya 3 and Chirya 7 were resistant to spot blotch, and tan spot races 1 and 5. The resistant wheat lines identified in this study represent potentially useful and untapped sources of resistance to multiple leaf spot diseases and should be utilized in wheat breeding programs in Nepal in order to develop wheat cultivars with broad-spectrum resistance.