期刊
JOURNAL OF SOLID STATE CHEMISTRY
卷 222, 期 -, 页码 66-70出版社
ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.jssc.2014.11.012
关键词
X-ray diffraction; Crystal structure; Wurtzite structure; I-III-VI2 semiconductors; AgGaO2
资金
- Japan Society for the Promotion of Science [25630283]
- Ministry of Education, Culture, Sports, Science, and Technology, Japan
- Grants-in-Aid for Scientific Research [25630283, 26289239, 14J00763] Funding Source: KAKEN
The structure of the wurtzite-derived beta-AgGaO2 was refined by Rietveld analysis of high-resolution powder diffraction data obtained using synchrotron X-ray radiation. The space group of the crystal is Pna2(1) with lattice parameters of a(0) = 5.56175 angstrom, b(0) = 7.14749 angstrom, and c(0) = 5.46875 angstrom. The deviation of O-Ag-O and M-O-M bond angles from the regular tetrahedral angle of 109.5 degrees was very large at similar to 8 degrees and similar to 11 degrees, respectively. The electronic structure of beta-AgGaO2 is discussed based on its structure, and the indirect band gap of beta-AgGaO2 was related to significant tetrahedral distortion. Although beta-AgGaO2 decomposes into metallic silver and Ga2O3 at a high temperature in any atmosphere, beta-AgGaO2 is stable up to 690 degrees C under an O-2 atmosphere. No direct transformation from the wurtzite-derived phase to a delafossite phase occurs in beta-AgGaO2. (C) 2014 Elsevier Inc. All rights reserved.
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