Complex Refractive Indices of Thin Films of Secondary Organic Materials by Spectroscopic Ellipsometry from 220 to 1200 nm

标题
Complex Refractive Indices of Thin Films of Secondary Organic Materials by Spectroscopic Ellipsometry from 220 to 1200 nm
作者
关键词
-
出版物
ENVIRONMENTAL SCIENCE & TECHNOLOGY
Volume 47, Issue 23, Pages 13594-13601
出版商
American Chemical Society (ACS)
发表日期
2013-11-06
DOI
10.1021/es403411e

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now