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Carrier-Suppressing Effect of Mg in Solution-Processed Zn-Sn-O Thin-Film Transistors

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ELECTROCHEMICAL AND SOLID STATE LETTERS
卷 15, 期 3, 页码 H78-H80

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ELECTROCHEMICAL SOC INC
DOI: 10.1149/2.012203esl

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  1. National Research Foundation of Korea (NRF)
  2. Korean Ministry of Education, Science and Technology (MEST) [2007-0055837]
  3. National Research Foundation of Korea [2007-0055837] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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We investigated the effect of Mg addition on solution-processed Zn-Sn-O (ZTO) thin-film transistors (TFTs). Because Mg affects the optical bandgap and the metal-oxygen bond in ZTO films, the carrier concentration of Mg-Zn-Sn-O (MZTO) films was suppressed by Mg. As the molar ratio of Mg increased in the MZTO TFTs annealed at 500 degrees C, the on/off ratio increased, and the sub-threshold gate swing (S.S) decreased considerably. As a result, the MZTO TFT showed a saturation mobility of 1.00 cm(2)/V s, an S. S of 0.92 V/decade, a threshold voltage (V-th) of 6.60 V, and an on/off ratio of 3.15x10(6). (C) 2012 The Electrochemical Society. [DOI: 10.1149/2.012203esl] All rights reserved.

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