Enhanced Etching, Surface Damage Recovery, and Submicron Patterning of Hybrid Perovskites using a Chemically Gas-Assisted Focused-Ion Beam for Subwavelength Grating Photonic Applications

标题
Enhanced Etching, Surface Damage Recovery, and Submicron Patterning of Hybrid Perovskites using a Chemically Gas-Assisted Focused-Ion Beam for Subwavelength Grating Photonic Applications
作者
关键词
-
出版物
Journal of Physical Chemistry Letters
Volume 7, Issue 1, Pages 137-142
出版商
American Chemical Society (ACS)
发表日期
2015-12-20
DOI
10.1021/acs.jpclett.5b02558

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