期刊
DATA & KNOWLEDGE ENGINEERING
卷 64, 期 1, 页码 312-329出版社
ELSEVIER
DOI: 10.1016/j.datak.2007.06.019
关键词
business process management; verification; event-driven process chains; YAWL; error prediction; logistic regression
Up to now there is neither data available on how many errors can be expected in process model collections, nor is it understood why errors are introduced. In this article, we provide empirical evidence for these questions based on the SAP reference model. This model collection contains about 600 process models expressed as Event-driven Process Chains (EPCs). We translated these EPCs into YAWL models, and analyzed them using the verification tool WofYAWL. We discovered that at least 34 of these EPCs contain errors. Moreover, we used logistic regression to show that complexity of EPCs has a significant impact on error probability. (c) 2007 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据