期刊
CRYSTALLOGRAPHY REPORTS
卷 55, 期 2, 页码 182-190出版社
PLEIADES PUBLISHING INC
DOI: 10.1134/S1063774510020033
关键词
-
资金
- Russian Academy of Sciences [27]
- Russian Foundation for Basic Research [7-02-00090-a]
- Program for Developing Computational, Telecommunication
- Ural Division of the Russian Academy of Sciences [UrO RAN-RTsP-2009, NSh-1955.2008.2]
Multilayer structures composed of four porous bilayers have been studied by high-resolution X-ray diffraction using synchrotron radiation, and the photoluminescence of these structures has been investigated at 4 K. The porous structures were formed by anodic oxidation of InP(001) substrates in aqueous HCl solution. The structural parameters of the sublayers were varied by changing the electrochemical etching mode (potentiostatic/galvanostatic). The X-ray scattering intensity maps near the InP 004 reflection are obtained. A model for scattering from such systems is proposed based on the statistical dynamical diffraction theory. Theoretical scattering maps have been fitted to the experimental ones. It is shown that a mathematical analysis of the scattering intensity maps makes it possible to determine the structural parameters of sublayers. The reconstructed parameters (thickness, strain, and porosity of sublayers and the shape and arrangement of pores) are in satisfactory agreement with the scanning electron microscopy data.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据