Phase Tuning, Thin Film Epitaxy, Interfacial Modeling, and Properties of YSZ-Buffered TiO2 on Si(001) Substrate

标题
Phase Tuning, Thin Film Epitaxy, Interfacial Modeling, and Properties of YSZ-Buffered TiO2 on Si(001) Substrate
作者
关键词
-
出版物
CRYSTAL GROWTH & DESIGN
Volume 12, Issue 9, Pages 4535-4544
出版商
American Chemical Society (ACS)
发表日期
2012-07-27
DOI
10.1021/cg3007124

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