标题
Micromorphology characterization of copper thin films by AFM and fractal analysis
作者
关键词
Atomic Force Microscopy, Fractal Dimension, Power Spectral Density, Fractal Analysis, Bidirectional Reflectance Distribution Function
出版物
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume 26, Issue 12, Pages 9630-9639
出版商
Springer Nature
发表日期
2015-08-18
DOI
10.1007/s10854-015-3628-5
参考文献
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- (2014) Slawomir Kulesza et al. APPLIED SURFACE SCIENCE
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- Structural characterizations of magnetron sputtered nanocrystalline TiN thin films
- (2007) Vipin Chawla et al. MATERIALS CHARACTERIZATION
- Thickness dependence of structural, electrical and optical properties of sprayed ZnO:Cu films
- (2007) Mustafa Öztas et al. THIN SOLID FILMS
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