Characterization of low-temperature solution-processed indium–zinc oxide semiconductor thin films by KrF excimer laser annealing

标题
Characterization of low-temperature solution-processed indium–zinc oxide semiconductor thin films by KrF excimer laser annealing
作者
关键词
-
出版物
CERAMICS INTERNATIONAL
Volume 40, Issue 6, Pages 8287-8292
出版商
Elsevier BV
发表日期
2014-01-15
DOI
10.1016/j.ceramint.2014.01.030

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