Quantifying ion-induced defects and Raman relaxation length in graphene

标题
Quantifying ion-induced defects and Raman relaxation length in graphene
作者
关键词
-
出版物
CARBON
Volume 48, Issue 5, Pages 1592-1597
出版商
Elsevier BV
发表日期
2010-01-07
DOI
10.1016/j.carbon.2009.12.057

向作者/读者发起求助以获取更多资源

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started