Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

标题
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
作者
关键词
-
出版物
CARBON
Volume 46, Issue 11, Pages 1435-1442
出版商
Elsevier BV
发表日期
2008-06-18
DOI
10.1016/j.carbon.2008.06.022

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