Characterising ChIP-seq binding patterns by model-based peak shape deconvolution

标题
Characterising ChIP-seq binding patterns by model-based peak shape deconvolution
作者
关键词
ChIP-seq, Quality control, Next-generation sequencing, Massive parallel sequencing
出版物
BMC GENOMICS
Volume 14, Issue 1, Pages 834
出版商
Springer Nature
发表日期
2013-11-26
DOI
10.1186/1471-2164-14-834

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started