Atomic Force Microscopy Stiffness Tomography on Living Arabidopsis thaliana Cells Reveals the Mechanical Properties of Surface and Deep Cell-Wall Layers during Growth

标题
Atomic Force Microscopy Stiffness Tomography on Living Arabidopsis thaliana Cells Reveals the Mechanical Properties of Surface and Deep Cell-Wall Layers during Growth
作者
关键词
-
出版物
BIOPHYSICAL JOURNAL
Volume 103, Issue 3, Pages 386-394
出版商
Elsevier BV
发表日期
2012-08-07
DOI
10.1016/j.bpj.2012.06.046

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