In-situ piezoresponse force microscopy cantilever mode shape profiling

标题
In-situ piezoresponse force microscopy cantilever mode shape profiling
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 118, Issue 7, Pages 072011
出版商
AIP Publishing
发表日期
2015-08-20
DOI
10.1063/1.4927809

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search