Temperature dependent behavior of thermal conductivity of sub-5 nm Ir film: Defect-electron scattering quantified by residual thermal resistivity

标题
Temperature dependent behavior of thermal conductivity of sub-5 nm Ir film: Defect-electron scattering quantified by residual thermal resistivity
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 117, Issue 2, Pages 024307
出版商
AIP Publishing
发表日期
2015-01-14
DOI
10.1063/1.4905607

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