Atomic layer deposition of Y2O3 and yttrium-doped HfO2 using a newly synthesized Y(iPrCp)2(N-iPr-amd) precursor for a high permittivity gate dielectric

标题
Atomic layer deposition of Y2O3 and yttrium-doped HfO2 using a newly synthesized Y(iPrCp)2(N-iPr-amd) precursor for a high permittivity gate dielectric
作者
关键词
-
出版物
APPLIED SURFACE SCIENCE
Volume 297, Issue -, Pages 16-21
出版商
Elsevier BV
发表日期
2014-01-17
DOI
10.1016/j.apsusc.2014.01.032

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