Band offsets of epitaxial Tm2O3 high-k dielectric films on Si substrates by X-ray photoelectron spectroscopy

标题
Band offsets of epitaxial Tm2O3 high-k dielectric films on Si substrates by X-ray photoelectron spectroscopy
作者
关键词
-
出版物
APPLIED SURFACE SCIENCE
Volume 258, Issue 16, Pages 6107-6110
出版商
Elsevier BV
发表日期
2012-03-08
DOI
10.1016/j.apsusc.2012.03.013

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