Surface topography (nano-sized hillocks) and particle emission of metals, dielectrics and semiconductors during ultra-short-laser ablation: Towards a coherent understanding of relevant processes

标题
Surface topography (nano-sized hillocks) and particle emission of metals, dielectrics and semiconductors during ultra-short-laser ablation: Towards a coherent understanding of relevant processes
作者
关键词
-
出版物
APPLIED SURFACE SCIENCE
Volume 255, Issue 20, Pages 8372-8376
出版商
Elsevier BV
发表日期
2009-06-24
DOI
10.1016/j.apsusc.2009.05.090

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