Berkovich indentation-induced deformation behaviors of GaN thin films observed using cathodoluminescence and cross-sectional transmission electron microscopy

标题
Berkovich indentation-induced deformation behaviors of GaN thin films observed using cathodoluminescence and cross-sectional transmission electron microscopy
作者
关键词
-
出版物
APPLIED SURFACE SCIENCE
Volume 254, Issue 21, Pages 6749-6753
出版商
Elsevier BV
发表日期
2008-04-30
DOI
10.1016/j.apsusc.2008.04.078

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