An examination of mass thickness measurements with X-ray sources

A method using X-rays to measure mass thickness is discussed. The method utilizes a filter to absorb low energy and characteristic photons so that the hardened X-ray spectra have a peaked energy distribution. An equivalent X-ray energy, which defines the attenuation in a material of interest can be used. The effect on the X-ray spectra of different filters is examined with Monte Carlo simulation using the EGSnrc package. A theoretical model for X-ray absorption that shows that the method can achieve good precision for a certain range of mass thicknesses is advanced. Experimental results agree well with the theoretical analysis. It is found that for a certain range of mass thicknesses, the relative error can be less than 1% for the aluminum alloy sample at the tube voltage of 30 or 45 kV. (c) 2008 Elsevier Ltd. All rights reserved.