Trapped charge mapping in crystalline organic transistors by using scanning Kelvin probe force microscopy

标题
Trapped charge mapping in crystalline organic transistors by using scanning Kelvin probe force microscopy
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 105, Issue 19, Pages 193303
出版商
AIP Publishing
发表日期
2014-11-14
DOI
10.1063/1.4901946

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now