Low power zinc-oxide based charge trapping memory with embedded silicon nanoparticles via poole-frenkel hole emission

标题
Low power zinc-oxide based charge trapping memory with embedded silicon nanoparticles via poole-frenkel hole emission
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 104, Issue 1, Pages 013112
出版商
AIP Publishing
发表日期
2014-01-14
DOI
10.1063/1.4861590

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