Nano-scale characterization of GaAsP/GaAs strained superlattice structure by nano-beam electron diffraction

标题
Nano-scale characterization of GaAsP/GaAs strained superlattice structure by nano-beam electron diffraction
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 104, Issue 11, Pages 113106
出版商
AIP Publishing
发表日期
2014-03-19
DOI
10.1063/1.4869030

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started